Filter for diffracted beam (Kβ filter) – LINEV Systems - X-ray Security Threat Detection Systems

Filter for diffracted beam (K_β filter)

LOT #X1001 | Designed for R. The appropriate material and filter thickness are selected depending on the X-ray tube anode material and required degree of K_β suppression.

$LV Analytical Accessories Filter for diffracted beam$

Description

One of the key factors for obtaining reliable statistical information during an experiment is a sample preparation. A properly prepared powdered sample is a number of crystallites not more than 10 μm, arranged in a random manner. Large crystallite sizes, as well as their non-random orientation lead to changes in the intensity of the peaks. As a result, obtained diffraction patterns do not correspond to the reference images presented in the database.

Mills, mortars, testing sieves are widely used for powdered sample preparation.

K_β filter material 0,025 mm	No.
Ni (²⁹Cu tube)	*Item No.* 04.03.102-01
Fe (²⁷Co tube)	*Item No. 0***4.03.102-02
Mn (²⁶Fe tube)	*Item No. 0***4.03.102-03
V (²⁴Cr tube)	*Item No. 0***4.03.102-04
Zr (⁴²Mo tube)	*Item No. 0***4.03.102-05
Another make	On request

Features:

Installed on the detector arm
Filter material (for corresponding X-ray tube anode material): V (Cr), Fe (Co), Mn (Fe), Ni (Cu), Zr (Mo)
Filter thickness: from 0,015 up to 0,200 mm
Simple installation and replacement

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