Background-free cuvette
LOT #C1002 | The cuvette is intended for high-precision measurement of small sample amounts. Background-free diffraction plates are made of silicon monocrystal made with a specific orientation. It is perfect for powder X-ray diffractometry when background noise and peaks should be avoided, ranging from 20 to 120 degrees 2θ.
Description
One of the key factors for obtaining reliable statistical information during an experiment is a sample preparation. A properly prepared powdered sample is a number of crystallites not more than 10 μm, arranged in a random manner. Large crystallite sizes, as well as their non-random orientation lead to changes in the intensity of the peaks. As a result, obtained diffraction patterns do not correspond to the reference images presented in the database.
Mills, mortars, testing sieves are widely used for powdered sample preparation.
| Make | No. |
| Background-free cuvette with a flat bottom | Item No. 126.33.075 |
| Background-free cuvette with a recess of 12 mm diameter and 0,5 mm depth | Item No. 126.33.073 |
| Others | on request |
Features:
- Circular shape, 25 mm diameter, 1 mm thickness
- Material: silicon monocrystal
- 2 makes: with and without recess
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